Group standard
VW 80302
Issue 2013-03
Class. No.:8ME2
Descriptors:
high-voltage contacts, high-voltage, contacts, Test Specification, LV 215-2
Motor Vehicle High-Voltage Contacts Test Specification
Preface
This standard is based on LV 215-2, which was drawn up by representatives of automobile manu‐facturers Audi AG, BMW AG, Daimler AG, Porsche AG, and Volkswagen AG in working group (WG) 4.3.3.
Deviations from the LV 215-2 are listed on the cover sheet of this standard. If modifications to indi‐vidual test sections become necessary in individual cases, these must be agreed upon separately between the department in charge and the relevant manufacturer.
Test reports will be accepted as long as the tests were performed by an independent testing insti‐tute that is accredited as per DIN EN ISO/IEC 17025. Acceptance of the test reports will not auto‐matically result in a release.
NOTE 1: The LV numbers listed in this document correspond to the standards listed in table 1.
Table 1
Working group (AK) document number
LV 214LV 215-1
LV 216-1
LV 216-2
大众集团Volkswagen standard number
VW 75174
VW 80304VW 75210-1VW 75210-2
Previous issues
VW 80302: 2009-09, 2013-02Changes
The following changes have been made to VW 80302: 2013-02:–Page 13 replaced
Always use the latest version of this standard.
This electronically generated standard is authentic and valid without signature.
The English translation is believed to be accurate. In case of discrepancies, the German version is alone authoritative and controlling.Numerical notation acc. to ISO/IEC Directives, Part 2.
Page 1 of 13
All rights reserved. No part of this document may be provided to third parties or reproduced without the prior consent of one of the Volkswagen Group’s Standards departments.
© Volkswagen Aktiengesellschaft
VWNORM-2012-05o
Page 2
LV 215-2: 2013-02
Contents
Page Test number structure (3)
Loads (3)
Properties tests (3)
General rules (3)
Determining the volume resistance (E 0.2, E 14.0, and E 16.0) (3)
"Crimp" definition (3)
PG 0Inspection of as-received condition (4)
PG 1Dimensions (5)
PG 2Material and surface analysis, contacts (5)
PG 3Material and surface analysis, housing and single-wire seal (5)
PG 4Contact overlap (6)
PG 5Mechanical and thermal relaxation behavior (6)
PG 6Interaction between contact and housing (6)
PG 7Handling and functional reliability of the housing (6)
PG 8Insertion and retention forces of the contact parts in the housing (7)
PG 9Pin insertion inclination/misuse safe (scoop-proofing) (7)
PG 10Contacts: Conductor pull-out strength (7)
PG 11Contacts: Insertion and withdrawal forces; insertion frequency (7)
PG 12Current heating, derating (8)
PG 13Housing influence on the derating (8)
PG 14Thermal time constant (current vs. temperature at n-times the nominal current) (8)
PG 15Electrical stress test (8)
PG 16Friction corrosion (8)
PG 17Dynamic load (8)
PG 18A Coastal climate load (9)
PG 18C De-icing salt load (9)
PG 19Environmental simulation (9)
PG 20Climate load of the housing (9)
PG 21 Long-term temperature aging (9)
PG 22A Chemical resistance (9)
PG 22B Chemical resistance, extended test (9)
PG 23Water leak tightness (9)
PG 24Impenetrability to paint (9)
PG 28Latching noise (10)
PG 29Blind plug retention force (10)
PG 50EMC test (10)
PG 51Protection against contact (12)
Page 3
LV 215-2: 2013-02 Test number structure
As per LV 214
Loads
As per LV 214
Properties tests
As per LV 214
As a supplement to LV 214:
E 0.2.3 Shielding volume resistance
E 0.3 Insulation resistance
E 0.4 Dielectric strength
E 50.1 Average wave impedance DIN EN 50289-1-11
E 50.2 Surface transfer impedance VG 95214-11
E 51.1 Protection against contact ISO 20653
General rules
As per LV 214
As a supplement to LV 214:
Only cables released as per LV 216-1/LV 216-2 must be used for high-voltage contacts.
This LV is an extension to LV 214.
If modifications to individual test sections become necessary in individual cases, these must be agreed upon separately between the appropriate department and the affected manufacturer.
In general: All tests in LV 214 are described as connector tests and must be conceptually applied
to threaded connections.
Determining the volume resistance (E 0.2, E 14.0, and E 16.0)
As per LV 214
Deviation: starting from class 4, measure the volume resistance as per DIN EN 60512-2-2 with a test current of 10 A.
"Crimp" definition
As per LV 214
Page 4
LV 215-2: 2013-02
PG 0 Inspection of as-received condition
As per LV 214
As a supplement to LV 214:
E 0.2.3 Shielding volume resistance, measuring method as per E 0.2 (transition from component
to cable shield)
Document the exact position of the measuring points.
Requirement:
The measured values must correspond to the manufacturer’s specifications. The limits for R1 and R2 must be adhered to (see LV 215-1) and the measured values (initial value, standard deviation for the corresponding specimens) must be documented accordingly in the test report. Limit R3 (see LV 215-1) must be adhered to and must be checked during the release tests for the component, since the actual material combinations will only be available at that point.
R1 = DC resistance between cable shield and connector shield
R2 = DC resistance between connector shield and interface shield
R3 = DC resistance between interface shield and unit
E 0.3 Insulation resistance
In addition, measure the insulation resistance between the contacts and the housing shielding.
Requirement:
R insul >200 megaohms with V = 1 000 VDC, t = 60 s
E 0.4 Dielectric strength (one-time test) SAE J1742
ISO 6469-3 with a test duration of 60 seconds and a leakage current <10 mA.
The test voltage must be selected from Table 1.
Page 5
LV 215-2: 2013-02
Table 1: Test voltages
RMS voltage connector AC voltage to be
applied
(RMS)
DC voltage to be
applied 50 – 100 V    1 000 V    1 600 V 110 – 300 V    1 600 V
2 500 V
300 – 1 000 V
1 000 V plus
2 times the connector's nominal voltage    1 600 V plus 3,2 times the connector's nominal voltage
Figure 1: Test setup Housing insulation:
Connect all circuits to each other (see Figure 1) and wrap the outside of the specimen in
conductive film.
Apply the test voltage between the film and the circuits for one minute. Document the results.
Conductor insulation:
Test each conductor individually by using the shield as the other reference point. Apply the test voltage between the conductors and the shield for one minute. Document the results.
Requirement:
During the test, no dielectric breakdown or flash-overs must occur between the individual chambers or between the chambers and the specimen's exterior.
PG 1 Dimensions  As per LV 214
PG 2 Material and surface analysis, contacts  As per LV 214
PG 3 Material and surface analysis, housing and single-wire seal
As per LV 214
As a supplement to LV 214: